ADE‐Pad series Test Socket are designed to provide maximum electrical performance with high yield repeatability and mechanical properties. These sockets are build with a wide range of ESD materials and high performance spring probes to achieve high test yield with lower test costs. Maintenance of these sockets are effortless and replacement of parts can be easily rebuild and replaced on site.

Pad Test Socket Specifications; Device Type QFN and LGA. Pitching 0.25 mm and above Contact Resistance < 100 mOhm Contact Force 20 to 35g Test Frequency > 10 GHz@‐1dB Contact Life > 200K insertions Temperat ure Range ‐45c to 125C Socket Material ESD Plastic/AL with ESD Coating Suitable for all lead free devices:

+ Socket Footprint		+ Sample Socket